LiteScope AFM-in-SEM

Unique Atomic Force Microscope LiteScope is designed to merge the strengths of AFM and SEM techniques, resulting in effective workflow and extending the possibilities of correlative microscopy and in-situ analysis that ware difficult or almost impossible by conventional instrumentation.

• In-situ multimodal & correlative analysis
• Optimized & time-efficient workflow
• Ultimate performance inside SEM
• Open-hardware design for easy customization

Customized Solutions

Modules & Accessories

Probes 

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