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LiteScope AFM-in-SEM
Unique Atomic Force Microscope LiteScope is designed to merge the strengths of AFM and SEM techniques, resulting in effective workflow and extending the possibilities of correlative microscopy and in-situ analysis that ware difficult or almost impossible by conventional instrumentation.
- In-situ multimodal & correlative analysis
- Optimized & time-efficient workflow
- Ultimate performance inside SEM
- Open-hardware design for easy customization
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